- Award-winning Conductive Anodic Filament (CAF) tester for detecting electrochemical migration in PCBs
- Scalable single chassis accommodates 1–16 measurement cards, supporting up to 256 channels
- High-precision measurement range of 10⁶ Ω to 10¹⁴ Ω with shielded precision electronics
- All 256 channels measured in under 10 seconds, optimized at <100ms per channel
- Multibias capability applies up to three different bias voltages simultaneously in a single test
- Internal bias voltage from 0V up to ±100V; external bias expandable to 1V–1,250V; high-voltage option of 470V–1,250V @ 10–50 Amp
- Fully selectable test intervals from a minimum of 1 minute, with unlimited maximum test duration
- Continuous monitoring of resistance, current, voltage, temperature, and humidity
- Supports 2-point, 5-point, and 9-point multi-point test pattern configurations
- Enables parallel testing of multiple PCBs to reduce overall testing time
- Tests to IPC, IEC, JNC, and user-defined specifications
- Comprehensive coverage suited to modern high-density boards
- Compatible with Windows 10 and above (64-bit)
- Early detection helps prevent costly field failures and recalls
Technical Specifications
| Specification | Value |
|---|---|
| Channels | 64, 128, or 256 |
| Measurement Range | 10⁶ Ω to 10¹⁴ Ω |
| Internal Bias Voltage | 0V, 3.3V, 5V, 10V, 12.5V, 15V, ±50V, ±100V |
| External Bias Voltage | 1V–100V (free selection); 1V–1,250V (external) |
| High Voltage Option | 470V–1,250V @ 10–50 Amp |
| Applied Voltage Range | +1V to 100V |
| Measurement Speed | <100ms per channel |
| All-Channel (256) Measurement Time | <10 seconds |
| Test Intervals | Selectable from 1 minute minimum |
| Maximum Test Duration | Unlimited |
| Weight | 17 kg (37.5 lbs) |
| Dimensions | 52 x 34 x 17 cm |
| Power Requirement | 110V/230V, switchable single phase |
| Operating System | Windows 10 onwards (64-bit) |
| Data Collected | Sampling time, elapsed time, resistance, current, applied voltage, temperature, humidity |
| Applicable Standards | IPC, IEC, JNC, user-defined specifications |